T&D World Magazine

IBM Journal of Research and Development Added to IEEE Xplore Digital Library

IEEE has announced that the IBM Journal of Research and Development is now available online as part of the IEEE Xplore digital library. IEEE and IBM have entered into an agreement to offer expanded access to all papers ever published in the top-cited journal, which now includes the IBM Systems Journal. Both peer-reviewed technical journals address advancements in science, technology and engineering of information systems.

The IBM Journal of Research and Development and IBM Systems Journal have been published online since 1998. In 2009, they merged into one fee-based online publication. Now, the combined journals and the complete back issue archives are available to researchers through the IEEE Xplore digital library.

“This marks the second major addition to IEEE Xplore digital library in 2010,” said Karen Hawkins, director of product management at IEEE. “We’re pleased to add the IBM Journal of Research and Development to other recent expansions of the IEEE Xplore digital library, including the IEEE-Wiley eBooks collection, and journals from the American Institute of Physics (AIP) and AVS.”

Going forward, IEEE assumes responsibility for article production, copy editing, data conversion, online hosting and maintenance. IBM will be in charge of content acquisition and peer review.

With the IBM journals add-on subscription, IEEE Xplore users will have access to:

  • The backfiles of two prestigious IBM journals:
    • IBM Journal of Research and Development
    • IBM Systems Journal (1962–2008)
  • Full-text PDFs of all issues from 1957
  • More than 5,000 articles in all, published bimonthly in IEEE Xplore
  • Topics including circuits, cloud computing, data preservation, spintronics, systems biology, virtual appliances, and more
  • Affordable access to the same top-cited information used by today’s most innovative companies and researchers
  • All the robust, intuitive features of the recently upgraded and expanded IEEE Xplore digital library
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